The Geox: The Shoe that Breathes | SpringerLink
Investigation on the passivation, band alignment, gate charge, and mobility degradation of the Ge MOSFET with a GeOx/Al2O3 gate stack by ozone oxidation
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Slow Trap Properties and Generation in Al2O3/GeOx/Ge MOS Interfaces Formed by Plasma Oxidation Process | ACS Applied Electronic Materials
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a) Swept I-V curves and (b) XRD spectra of Ni/GeOx/ nc-TiO 2 /TaON/TaN... | Download Scientific Diagram
Slow Trap Properties and Generation in Al2O3/GeOx/Ge MOS Interfaces Formed by Plasma Oxidation Process | ACS Applied Electronic Materials
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Izik Lavy on LinkedIn: #teamwork #digital #insurance #underwriting #propertyinsurance #ai #ml…
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Slow Trap Properties and Generation in Al2O3/GeOx/Ge MOS Interfaces Formed by Plasma Oxidation Process | ACS Applied Electronic Materials
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Slow Trap Properties and Generation in Al2O3/GeOx/Ge MOS Interfaces Formed by Plasma Oxidation Process | ACS Applied Electronic Materials
/cloudfront-us-east-2.images.arcpublishing.com/reuters/BLM6ZD72RROIRCD72MYEOQMMB4.jpg "Geox lowers 2023 sales guidance after setback in May | Reuters")